Compiler Optimizations Do Impact the Reliability of Control-Flow Radiation Hardened Embedded Software

This paper characterizes how compiler optimizations impact software control-flow reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation induced softerrors occurring in branches. Supported by a comprehensive fault injection campaign using an established benchmark suite in the embedded systems domain, we show that the careful selection of the available compiler optimizations is necessary to avoid a significant decrease of software reliability while sustaining the performance boost those optimizations provide.